Correlation between a deep hole trap and the reverse annealing effect in neutron - irradiated silicon detectors ♣
نویسندگان
چکیده
We report on a correlation between a deep hole trap observed by TSC (Thermally Stimulated Current) and the so-called reverse annealing effect of the effective doping concentration in neutron-irradiated silicon detectors.
منابع مشابه
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